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Mgr. Mojmír Meduňa, Ph.D.

Date and place of birth:

4th Decembre 1974, in Frýdek Místek, Czech Republic

Education:

1981-1985
primary school, Frýdek Místek, Czech Republic
1985-1989
primary school, Dolní Věstonice, Czech Republic
1989-1993
secondary grammar school, kpt. Jaroše, Brno
1993 - 1998
Study of physics, Faculty of Science, Masaryk University, Brno, Czech Republic
Diploma thesis: "X-ray reflectivity on smooth silicon surfaces"
at the Department of Solid State Physics under supervision of prof. Václav Holý
1998 - 2002
Doctorate study at the Institute of Solid State Physics, Faculty of Science, Masaryk University, Brno, Czech Republic
Ph.D. thesis: "X-ray reflectivity on laterally structured multilayers"
at the Department of Solid State Physics under supervision of prof. Václav Holý
2002 - 2004
work on EU projects as a post doctoral researcher in the x-ray group of prof. Günther Bauer
at the Institute of Semiconductor Physics, J.Keppler University, Linz, Austria
since July 2004
research worker at the Department of Condensed Matter Physics, Masaryk University, Brno, Czech Republic
since January 2011
also a researcher at the CEITEC - Functional Properties of Nanostructures, Masaryk University, Brno, Czech Republic

Professional experience:

August 1997
one-week stay at the Institute of Physics of Czech Academy of Science in Prague
June 1999-November 2001
two four-weeks and one six-weeks stays at the Institute of Semiconductor Physics, Johannes Kepler University, Linz, Austria, in the group of prof. Günter Bauer
Oktober 1999-April 2001
in summary four one-week measurement periods at the synchrotron ESRF in Grenoble, France
June 2001-September 2002
research assistant at the Institute of Condense Matter Physics, Masaryk University, Brno, Czech Republic
March 2001, November 2001
short research experiments at the Institute of Scientific Instruments, Academy of Sciences of the Czech Republic, Brno
since December 2002
a series of week experiments at european synchrotrons; ESRF in Grenoble, DESSY in Hamburg, BESSY in Berlin and SLS at PSI in Villingen

Research interests:

Structural studies of interface morphology of thin layers, semiconductor nanostructures and SiGe heterostructures, using x-ray reflectivity and diffraction techniques, atomic force microscopy...

Other skills:

MS Windows, UNIX/Linux, TeX, LaTeX, MS Office, CorelDraw, Origin, GIMP,Gnuplot, programming in C++, Matlab, Maple and other ...

English and German fluently, Russian passive, Czech native

Publications:

ResearcherID: E-2474-2012

Conferences:

Look here up to 2005